SY-8217 B-H Analyzer
B-H curve measurement over 10 Hz to 5 MHz.
The standard core loss measurement tool to replace U-function meters.
The SY-8217 measures the magnetization characteristics of soft
magnetic materials with high accuracy and in a short time over a wide
frequency range from 10 Hz to 5 MHz. It is a powerful tool for research,
development, manufacturing and inspection of low-loss magnetic
materials for use in compact motor yokes, flyback transformers for TV, highfrequency
power transformer, etc.
Incorporating an oscillator for measurements and digitizer in a
compact, desktop type cabinet, the SY-8217 is the ideal repalcement for an
existing U-function meter as the standard tool for core loss measurement.
*Wide measurement frequency bandwidth
The frequency range for measurement ranges from 10 Hz to 5 MHz.
An FFT arithmetic circuit permits automatic compensation and calibration of frequency characteristics of the measurement system.
High-speed measurement can be performed in approx. 3 seconds, considerably improving measurement efficiency.
*Compliance with JIS C2514, JIS H7153 and EMAS 5003.
Ideal for estimation of everything from yoke materials for compact motors to the materials for high-frequency transformers.
JIS C2514: E-shaped ferrite core. JIS H7153: High-frequency core loss test method for amorphous metallic cores.
EMAS 5003: Test method for ferrite cores of power applications.
*Color TFT display
The bright color TFT display shows the characteristic values, B-H curves and excitation waveforms simultaneously.
*Printer and 3.5-inch FDD provided as standard
The measurement results can be printed out immediately. Convenient for data sorting. The results can also be output to a 3.5-inch floppy
disk in the csv format, then loaded in a PC and sorted using tabulation software.
*GP-IB interface provided as standard
An automated measurement system can be constructed with a PC.
*Compact, desktop size
Simple and easy to use design.
*Development and inspection of high-frequency power cores, micromotor yokes, etc.
*Core loss measurement by replacing a U-function meter.
*Manufacturing and inspection of amorphous thin films and amorphous cores.
Example of Combination
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